SP3011-06UTG

The SP3011 integrates six channels of ultra-low capacitance
rail-to-rail diodes and an additional zener diode to provide
protection for USB 3.0 ports that may experience
destructive electrostatic discharges (ESD). This high
density array can safely absorb repetitive ESD strikes at the
maximum level specified in the IEC 61000-4-2 international
standard (Level 4, ±8kV contact discharge) without
performance degradation. It’s extremely low loading
capacitance makes it ideal for protecting any high-speed
signal pins


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    SPECIFICATION

    • ESD, IEC 61000-4-2, ±8kV
    contact, ±15kV air
    • EFT, IEC 61000-4-4, 40A
    (5/50ns)
    • Lightning, IEC 61000-4-5,
    3A (8/20μs)
    • Low capacitance of 0.4pF
    (TYP) per I/O
    • Low leakage current of
    0.1μA (TYP) at 5V
    • Small form factor μDFN
    (JEDEC MO-229) package
    saves board space
    • RoHS compliant and leadfree
    • AEC-Q101 qualified